JEOL USA Scanning Electron Microscopes (SEM

By: Jeol Usa  09-12-2011
Keywords: Electron Microscopes, Scanning Electron Microscopes

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.

We offer a wide range of SEM models:

JEOL USA has also developed many unique solutions for SEM applications including:

  • Stage navigation system
  • Hot cell
  • Environmental chamber

We offer tailored applications solutions in concert with our partners, including:

Additional Reading:

Keywords: Electron Microscopes, Scanning Electron Microscopes

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JEOL USA Electron Optics Instruments

Today’s generation of electron microscopes deliver extremely high resolution for nanotechnology research and unprecedented quality for imaging fine surface details, analyzing biological and fabricated samples at the atomic level, and seeing microscopic details as they really are, magnified hundreds of thousands of times.