Fibics Incorporated : FIB Services - Ottawa

By: Fibics  09-12-2011
Keywords: Focused Ion Beam, SEMICONDUCTOR DEVICE, Device Modification,

Our goal of developing applications of Focused Ion Beam (FIB) microscopy in the fields of Metallurgy and Materials Science.  Since acquiring its first FIB in 1997, Fibics has developed an international reputation for its work in both metallurgy/materials science and semiconductor device modification (microsurgery) as well as in TEM specimen preparation, “nanomachining” and analysis.

Keywords: Device Modification, Focused Ion Beam, Focused Ion Beam Microscopy, SEMICONDUCTOR DEVICE,