Extended Head

By: Asylum Research  09-12-2011
Keywords: Atomic Force Microscopy

As sample features increase in height, a larger Z-range is required. Asylum Research has developed the MFP-3D Extended Head for use in its MFP-3D Atomic Force Microscopy (AFM) Systems. The unique head design allows a scan range of 40µm in Z for samples with higher features, and in particular, for bioscience applications including living cells and plant imaging.

The MFP-3D Extended Head utilizes the same Nanopositioning System (NPS™) sensors found in the standard head for unprecedented precision and accuracy. Z sensor noise is <0.3nm Adev in a 0.1Hz-1 kHz bandwidth (BW) and sensor non-linearity less than 0.2% (Adev/full travel) at full scan; Z height noise <0.06nm Adev, 0.1Hz-1kHz BW.

Keywords: Atomic Force Microscopy

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