Boundary Scan(1149.1) Manufacturing Test

By: Intellitech  09-12-2011
Keywords: Programming, Diagnostics

ScanExecutive has been designed so that tests developed using the EclipseTM Test Development Environment - Scan Path Integrity Test (SPIT), Virtual Interconnect Test (VIT), FLASH programming, CPLD programming and Virtual Component Cluster Test (VCCT) can be seamlessly applied to a Unit Under Test (UUT) in predefined flows that are controlled with ScanExecutive's flexible Scripting language based on industry standard . Intellitech enables you to merge JTAG tests with GPIB/VISA and USB Instruments wtihout adding the cost of an additional runtime such as Labview or HP VEE.

     "High quality board and system test, and effective board and system debug, are essential in ensuring the reliability and availability of Sun Microsystem's products. Intellitech's Eclipse and scan-based test is critical to meeting this goal. Sun has used, and is continuing to use, Eclipse on products ranging from processor modules to Enterprise servers. We have found Eclipse from Intellitech to be a flexible, cost effective test solution, which is deployed throughout Sun Microsystems as a part of Sun's test process."     

Scott Davidson
Manager DFT Technology
Sun Microsystems


ScanExecutive Test Application

ScanExecutive applies test data to a Unit Under Test (UUT) based on the information contained in a single (.tst) file. The test engineer creates this .tst file in advance and supplies it with information such as the location and name of the Eclipse database, DUT options file, and ScanExecutive Scripting Language (SSL) file(s) and optionally, any debug files for using Visual Fault AnalyzerTM (VFATM) and Schematic Logic ProbeTM (SLPTM).

ScanExecutive GUI Increases the Throughput and Efficiency of the Manufacturing test Process

At the conclusion of a test, the ScanExecutive Test Status Window will display the UUT's serial number, its lot type, the begin/end time of the test as well as diagnostic output. Diagnostics are presented in the standard Eclipse Pinfault diagnostic format, which displays failures to the device pin level for each Serial Vector Format (SVF) file that has been applied to the UUT. In addition, all ScanExecutive output could be directed to a file or printer.

Intellitech's Integrated Test Flow

ScanExecutive Requirements

ScanExecutive software is available for Microsoft Windows 98/NT/ME/2000/XP and Sun Solaris 9. ScanExecutive can be licensed as node locked or floating and uses Globetrotter FLEXlm software.

Eclipse ScanExecutive Production Test Station Feature Set

  • Intuitive GUI simplifies the application of test data in high-volume manufacturing flows
  • ScanExecutive's scripting language lowers the cost of test development by eliminating the need of C++ development
  • ScanExecutive supports numerous hardware test application alternatives
  • Multiple executing modes prevent unintentional test setup and program changes
  • Optionally debug test failures in production using SLP and VFA
  • Administrative login mode to control user program privileges allows supervisors to maximize productivity.
  • User Level sensitive scripting allows test engineers to write scripts that display information appropriate to the experience of user
  • Optional PT100 Parallel Tester enables industry's lowest cost test for 1149.1 compliant PCBs

     "Placing pads for test based on physical access is no longer an option for us; it increases PCB layout time and decreases routing efficiency.  Intellitech's boundary-scan technology allows us to continue to get high digital test fault coverage without test pads."     

Zack Matisis
Chief Engineer
LTX Corporation


Keywords: Diagnostics, Programming

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