The 20/20 XL Film™ Thickness Measurement tool is designed for thin film thickness measurement. Built to your specifications, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the best performance for film thickness measurement capabilities for many devices. It is easy to use yet able to non-destructively measure film thickness of even sub-micron sized features. As such, the 20/20 XL Film™ represents a giant leap forward in film thickness measurement and UV-visible-NIR microspectroscopy.
Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy, for through silicon inspection, are also offered.
The 20/20 XL Film™ microspectrophotometer is simple to use, the measurements are non-contact, non-destructive and the spectral data is unmatched.